Imager Test Chips in 2.5-, 0.35- and 0.15- $$\upmu $$ μ m CMOS Technologies

Autor:	Josep Maria Margarit
Rok vydání:	2016
Předmět:	CMOS Computer science business.industry Test procedures ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Experimental validation business Computer hardware Test (assessment)
Zdroj:	Low-Power CMOS Digital Pixel Imagers for High-Speed Uncooled PbSe IR Applications ISBN: 9783319499611
DOI:	10.1007/978-3-319-49962-8_5
Popis:	The experimental validation of any integrated imager design is usually hard to achieve, since it involves not only the proper electrical test procedures of any IC, but also the development of a custom lab setup for optical characterization as well. Due to practical limitations, this optical part of the imager test has to deal with the following challenges
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c3bb6d724f063b7c4fed4e2556a67cbe https://doi.org/10.1007/978-3-319-49962-8_5 Zobrazit plný text záznamu