Elastic Force on a Point Defect in or Near a Surface Layer

Autor:	H. Yua, S. C. Sanday, David Bacon
Rok vydání:	1996
Předmět:	Mechanical equilibrium Materials science Mechanical Engineering Geometry Substrate (electronics) Condensed Matter Physics Layer thickness law.invention Surface conductivity Mechanics of Materials Position (vector) law Free surface Point (geometry) Surface layer Composite material
Zdroj:	Journal of Applied Mechanics. 63:1042-1045
ISSN:	1528-9036 0021-8936
DOI:	10.1115/1.2787228
Popis:	The elastic force on a point defect within or near a surface layer is determined by the image method. There is no stable equilibrium position for the point defect in the surface layer, it is attracted either to the free surface or to the interface. When the point defect is in the substrate it is attracted to the interface when the surface layer is softer than the substrate and to an equilibrium position in the substrate when the surface layer is stiffer than the substrate, the equilibrium position being a function of the elastic constants and the layer thickness.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c3a8de003ae78e2dce3e83975ef87443 https://doi.org/10.1115/1.2787228 Zobrazit plný text záznamu