Optical Properties of Ultrathin Electrodeposited CdS Films Probed by Resonance Raman Spectroscopy and Photoluminescence

Autor:	B. Edward Boone and, Curtis Shannon
Rok vydání:	1996
Předmět:	Photoluminescence Thin layers business.industry Chemistry Resonance Raman spectroscopy General Engineering Analytical chemistry Resonance symbols.namesake Semiconductor Monolayer symbols Physical and Theoretical Chemistry business Raman spectroscopy Raman scattering
Zdroj:	The Journal of Physical Chemistry. 100:9480-9484
ISSN:	1541-5740 0022-3654
DOI:	10.1021/jp960222c
Popis:	We report resonance Raman and photoluminescence data from ultrathin films of CdS grown on Au substrates using electrochemical atomic layer epitaxy (ECALE). Samples ranged in coverage from 25 to 200 monolayers. Quantitative analysis of resonance Raman intensities leads to several important conclusions. First, ECALE does not involve growth by random precipitation of CdS onto the Au surface; contiguous thin layers of material are deposited. Second, the electronic structure of the films in this coverage regime corresponds to that of bulk CdS. Finally, charge carriers are rapidly trapped at the surface of the semiconductor on the time scale of the Raman scattering event; the trapping rate decreases linearly as a function of CdS coverage.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c3a214584391b43cf6c6bca6241f1fed https://doi.org/10.1021/jp960222c Zobrazit plný text záznamu