Radiation-Pressure-Enabled Traceable Laser Sources at CW Powers up to 50 kW
| Autor: | Joshua A. Hadler, Ivan Ryger, Kyle A. Rogers, Tam Vo, Alexandra B. Artusio-Glimpse, John H. Lehman, Daniel King, Paul A. Williams |
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| Rok vydání: | 2019 |
| Předmět: |
Physics
business.industry 020208 electrical & electronic engineering 02 engineering and technology Laser Semiconductor laser theory law.invention Power (physics) Photodiode Optics law 0202 electrical engineering electronic engineering information engineering Calibration Measurement uncertainty Continuous wave Laser power scaling Electrical and Electronic Engineering business Instrumentation |
| Zdroj: | IEEE Transactions on Instrumentation and Measurement. 68:1833-1839 |
| ISSN: | 1557-9662 0018-9456 |
| Popis: | Radiation pressure has recently been shown to have practical application for multikilowatt continuous wave (CW) laser power measurement. One key advantage lies in its ability to measure without absorbing the laser beam. This enables a new measurement paradigm where laser power can be measured traceable to the SI without perturbing the beam. Combining this measurement scheme with a laser constitutes a “traceable source” where laser output power is traceable to the SI in real time. This greatly simplifies the calibration process for multikilowatt laser power meters and yields a path to high-accuracy laser-based material processing. Here, we discuss the state of the art of this approach by describing recent results from calibrations of laser power meters performed using a radiation-pressure-enabled traceable source at CW powers from 1 to 50 kW. We describe measurement results and uncertainty contributions with expanded uncertainties at or below 1.7% for powers above 10 kW. We also briefly discuss the status of development of a radiation-pressure-based technology designed to provide source traceability in the laser manufacturing environment. |
| Databáze: | OpenAIRE |
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