Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence

Autor:	V. A. Greenhut, S. Weissmann, J. Chaudhuri, Z.H. Kalman
Rok vydání:	1983
Předmět:	Materials science Silicon Scanning electron microscope business.industry X-ray Analytical chemistry chemistry.chemical_element Electron Fluorescence General Biochemistry Genetics and Molecular Biology Particle detector Optics chemistry Luminescence business Excitation
Zdroj:	Journal of Applied Crystallography. 16:606-610
ISSN:	0021-8898
DOI:	10.1107/s0021889883011164
Popis:	A method is presented for enhancing the fluorescence of the silver precipitates in the microfluorescent analysis of X-ray topographs by scanning electron microscopy or similar electron microprobes. The method is based on the indirect excitation of the silver fluorescence by depositing a thin suitable metal film on the emulsion of a nuclear track plate. Theoretical aspects of the method are presented and experimentally verified. The method was applied to determine the elastic strain distribution in a bent silicon plate containing a hole by measuring the opacities of the exposed and developed topograph obtained from the specimen.
Databáze:	OpenAIRE
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