Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction
| Autor: | J.-P. Contour, Christian Colliex, Jean-Luc Maurice, D. Imhoff, Albert Fert, Alain Barthélémy, L. Samet, F. Pailloux, N. Bonnet |
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| Rok vydání: | 2003 |
| Předmět: |
Condensed matter physics
Magnetoresistance Chemistry Electron energy loss spectroscopy Analytical chemistry Condensed Matter Physics Atomic units Electronic Optical and Magnetic Materials Tunnel magnetoresistance Magnetization Tunnel junction Transmission electron microscopy High-resolution transmission electron microscopy Instrumentation |
| Zdroj: | The European Physical Journal Applied Physics. 24:215-221 |
| ISSN: | 1286-0050 1286-0042 |
| DOI: | 10.1051/epjap:2003071 |
| Popis: | We use High Resolution Electron Microscopy (HRTEM) together with Electron Energy Loss Spectroscopy (EELS) to analyze the crystallography and the chemical configuration of interfaces in a state- of-the-art La2/3Sr1/3MnO3/SrTiO3/La2/3Sr1/3MnO3 tunnel junction. EELS indicates that manganese ions keep their bulk valency up to the last atomic plane in contact with the insulator. Tunnel magnetoresistance however decreases with temperature faster than magnetisation in these samples. Quantitative HRTEM reveals some local departures from chemical abruptness at the interfaces, which could play a role in this decrease. |
| Databáze: | OpenAIRE |
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