PROD: A VLSI Fault Diagnosis System
| Autor: | Peter Odryna, Andrzej J. Strojwas |
|---|---|
| Rok vydání: | 1985 |
| Předmět: |
Very-large-scale integration
Engineering business.industry ComputerApplications_COMPUTERSINOTHERSYSTEMS Probability density function Hardware_PERFORMANCEANDRELIABILITY computer.software_genre Fault (power engineering) Expert system Manufacturing cost Reliability engineering Computer engineering Hardware and Architecture Probability distribution Electrical and Electronic Engineering Medical diagnosis business computer Software Parametric statistics |
| Zdroj: | IEEE Design & Test of Computers. 2:27-35 |
| ISSN: | 0740-7475 |
| Popis: | Faults in the manufacturing of VLSI chips lower the effective yield, thus increasing manufacturing cost. Early diagnosis of faults can avoid this sitution. Such diagnoses can be made by PROD, a diagnostic expert system that analyzes the joint probability density function of measured IC parameters density fuction of measured IC parameters to determine the source of faults resulting in faults chips. PROD can identify both parametric and catastrophic faults, and the expert system can be expanded to diagnose faults that cannot be described quantitatively. This article describes PROD's diagnostic algorithms and their implementation in the complete diagnostic system, and includes several exmples that illustrate its capabilities. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|