Characterization of Tunneling Current Through Ultrathin Silicon Dioxide Films by Different-Metal Gates Method
| Autor: | Takaaki Hirokane, Naoto Yoshii, Tatsuya Okazaki, Shinichi Urabe, Kazuo Nishimura, Satoru Morita, Mizuho Morita |
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| Rok vydání: | 2006 |
| Zdroj: | ECS Meeting Abstracts. :749-749 |
| ISSN: | 2151-2043 |
| DOI: | 10.1149/ma2005-02/19/749 |
| Popis: | not Available. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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