Plasma Repair of Insulation Crack Defects for Cable Accessories

Autor:	Jiazhen Duan, Hongmao Huang, Ruxin Shi, Xiaoqiang Chen, Kun Xie, Chengyan Ren, Tao Shao
Rok vydání:	2022
Zdroj:	2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c239238059ec1a8ae3864438899d15e1 https://doi.org/10.1109/ichve53725.2022.9961411 Zobrazit plný text záznamu