Application of infrared thermography to the characterization of multicristalline silicon solar cells

Autor:	A. Kaminski, P.L. Vuillermoz, J. Jouglar, A. Laugier, O. Nichiporuk
Rok vydání:	2000
Předmět:	Materials science integumentary system Silicon business.industry Solar cell fabrication Infrared chemistry.chemical_element Hot spot (veterinary medicine) Characterization (materials science) Optics chemistry Thermography Optoelectronics business Short circuit
Zdroj:	Proceedings of the 2000 International Conference on Quantitative InfraRed Thermography.
DOI:	10.21611/qirt.2000.023
Popis:	In this study, infrared thermography is used to detect defects in large area (100 cm 2 ) multicrystalline silicon solar cells. Hot spot observed in biased solar cells are correlated to a critical processing step which needs to be improved. Usually these shunts are due to short circuit of the junction which leads to a local heating. By this way infrared thermography appears as a very useful tool to improve solar cell fabrication and efficiency.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c21e9084a8ea720decb2bb11cd7efd26 https://doi.org/10.21611/qirt.2000.023 Zobrazit plný text záznamu