Measurements of Magnetic Compton Profiles of Amorphous Fe-Tb Thin Films Using Circularly Polarized X-Rays

Autor:	Susumu Nanao, Yoji Sakurai, Chan Wook Kim, Y. Tanaka
Rok vydání:	2004
Předmět:	Materials science Condensed matter physics X-ray magnetic circular dichroism Mechanics of Materials business.industry Mechanical Engineering Optoelectronics General Materials Science Thin film Condensed Matter Physics business Amorphous solid
Zdroj:	Materials Science Forum. :1073-1076
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.449-452.1073
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c1f5a70db80f53889baae40cb5ecdbee https://doi.org/10.4028/www.scientific.net/msf.449-452.1073 Zobrazit plný text záznamu