Reduced Probability of Noise Introduced Malfunction in RSFQ Circuits by Implementing Intrinsic $\pi$-Phaseshifter
| Autor: | F.H. Uhlmann, P. Febvre, Thomas Ortlepp, O. Mielke |
|---|---|
| Rok vydání: | 2009 |
| Předmět: |
Computer science
business.industry Noise reduction Electrical engineering Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics Noise (electronics) Electronic Optical and Magnetic Materials law.invention Computer Science::Emerging Technologies law Rapid single flux quantum Phase noise Hardware_INTEGRATEDCIRCUITS Flicker noise Electronics Electrical and Electronic Engineering Resistor business Hardware_LOGICDESIGN Electronic circuit |
| Zdroj: | IEEE Transactions on Applied Superconductivity. 19:621-625 |
| ISSN: | 1558-2515 1051-8223 |
| DOI: | 10.1109/tasc.2009.2018145 |
| Popis: | The rapid single flux quantum electronics is characterized by a low switching energy, which makes it susceptible to noise introduced bit-errors. For industrial applications a certain noise immunity is required which is still a challenge especially for circuits of higher complexity. We analysed the influence of each individual resistor in a toggle flip-flop circuit to the overall bit-error rate. The shunt resistors of comparator structures are the dominant noise sources and bias resistors have almost no influence. |
| Databáze: | OpenAIRE |
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