Determination of the parameters of phosphor activators in thin-film electroluminescent capacitor structures
Autor: | M. K. Samokhvalov, R. R. Davydov |
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Rok vydání: | 2002 |
Předmět: | |
Zdroj: | Technical Physics Letters. 28:1049-1051 |
ISSN: | 1090-6533 1063-7850 |
DOI: | 10.1134/1.1535499 |
Popis: | A method for determining the concentration and electron-impact excitation cross section of activated emission centers in the phosphor layer of a thin-film electroluminescent capacitor structure, based on measurements of the brightness as a function of the applied alternating voltage amplitude and frequency, is analyzed. The error of determination of the parameters of electroluminescence excited by alternating-sign ramp voltage is evaluated. The parameters of electroluminescent structures based on the ZnS:Mn, ZnS:TbF3, and ZnS:SmF3 films are presented. |
Databáze: | OpenAIRE |
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