High Precision Measurement of Sub-Nano Ampere Current in ATE Environment

Autor:	Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Rok vydání:	2021
Zdroj:	2021 IEEE 30th Asian Test Symposium (ATS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c1dfe01612ce8993ba9f8646bed719a9 https://doi.org/10.1109/ats52891.2021.00036 Zobrazit plný text záznamu