MBU characterization of NAND-Flash memories under heavy-ion irradiation

Autor:	Veronique Ferlet-Cavrois, D. Walter, Martin Herrmann, Heikki Kettunen, Fritz Gliem, Kai Grurmann
Rok vydání:	2011
Předmět:	Flash (photography) Materials science business.industry Electrical engineering NAND gate Optoelectronics Angular dependence business Heavy ion irradiation Characterization (materials science)
Zdroj:	2011 12th European Conference on Radiation and Its Effects on Components and Systems.
DOI:	10.1109/radecs.2011.6131305
Popis:	The angular dependence of the MBU-Cross-Section of two 8-Gbit-SLC-NAND-Flash and the orientation of the MBU-pattern has been measured.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c1d961c9b95beb5bbb2f141f90c61c0e https://doi.org/10.1109/radecs.2011.6131305 Zobrazit plný text záznamu