0.4 mW, 0.27 pJ/bit true random number generator using jitter, metastability and current starved topology
Autor: | Ashok Srivastava, Dhirendra Kumar, Prasanna Kumar Misra, Manish Goswami, Sajai Vir Singh, Rahul Anand |
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Rok vydání: | 2020 |
Předmět: |
010302 applied physics
Random number generation Computer science 020208 electrical & electronic engineering Topology (electrical circuits) 02 engineering and technology Ring oscillator Topology 01 natural sciences Sampling (signal processing) CMOS Control and Systems Engineering 0103 physical sciences 0202 electrical engineering electronic engineering information engineering NIST Electrical and Electronic Engineering Randomness Jitter |
Zdroj: | IET Circuits, Devices & Systems. 14:1001-1011 |
ISSN: | 1751-8598 1751-858X |
Popis: | This study introduces the design of true random number generator (TRNG) using jitter, metastability and current starved topology. The proposed design consisted of a current starved inverter-based ring oscillator (RO) with a high-frequency divider block (designed by T-FF followed by D-FF to address setup and hold time issues), jitter extraction and metastable block followed by two sampling blocks. The design avails fewer amenities to yield the reduction in hardware and enhances the degree of randomness. The post-layout simulation of the proposed work was performed using a 180 nm CMOS technology environment in the Cadence Virtuoso tool. The speed and power dissipation achieved are 1.5 Gbps and 0.4 mW, respectively, with an efficiency of 0.27 pJ/bit. The effect of temperature and variation in supply voltages (by 10% around its nominal value) is also investigated on the generated random numbers through parametric analysis. For validation of randomness, the generated random signals are first sampled and then converted in binary format using MATLAB and finally verified by Kolmogorov–Smirnov and Chi-square test for the uniformity and independency. The validity of the proposed work is done by NIST 800.22 statistical test suite. The proposed TRNG design achieved a very high-pass efficiency. |
Databáze: | OpenAIRE |
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