Comparative study of Sr and Ba adsorption on Si(1 0 0)
| Autor: | Xiaoming Hu, William J. Ooms, John L. Edwards, Jay Curless, Ravindranath Droopad, K. Eisenbeiser, Dror Sarid, Zhiyi Jimmy Yu |
|---|---|
| Rok vydání: | 2001 |
| Předmět: |
Strontium
Auger electron spectroscopy Silicon Low-energy electron diffraction Analytical chemistry General Physics and Astronomy chemistry.chemical_element Barium Surfaces and Interfaces General Chemistry Dielectric Condensed Matter Physics Surfaces Coatings and Films law.invention Adsorption chemistry law Scanning tunneling microscope |
| Zdroj: | Applied Surface Science. 181:103-110 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/s0169-4332(01)00379-8 |
| Popis: | The adsorption of submonolayers and monolayers of strontium and barium on Si(1 0 0) are reported using low energy electron diffraction (LEED) and Auger electron spectroscopy (AES). The samples were prepared by deposition at room temperature followed by annealing at elevated temperatures, and by deposition with the silicon held at a high temperature. The adsorbate phases were observed using LEED and the surface coverage calibration using AES and ultrahigh vacuum scanning tunneling microscopy (UHV-STM). Marked differences between the adsorption properties of the strontium and barium adsorbates have been found, shedding light on their prospective role as templates for the growth of perovskites used as high dielectric constants for electronic device applications. |
| Databáze: | OpenAIRE |
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