THz Near-Field Nanoscopy at 25 Nanometer Spatial Resolution
| Autor: | Max Eisele, Andreas J. Huber, Tobias Gokus |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Condensed Matter::Other business.industry Terahertz radiation Physics::Optics Near and far field Semiconductor device 01 natural sciences Terahertz spectroscopy and technology 010309 optics Condensed Matter::Materials Science 0103 physical sciences Microscopy Optoelectronics Near-field scanning optical microscope Spectroscopy business Image resolution |
| Zdroj: | Conference on Lasers and Electro-Optics. |
| DOI: | 10.1364/cleo_si.2018.sw3d.2 |
| Popis: | We combine terahertz time-domain spectroscopy with near-field microscopy to achieve extreme sub-wavelength spatial resolution ( |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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