Advanced process control for high quality R&D and production of MOVPE material by RealTemp™

Autor: Bernhard Hirschauer, H. Malm, Carl Asplund, Jan Borglind, A. Parekh, S. Becanovic
Rok vydání: 2003
Předmět:
Zdroj: Journal of Crystal Growth. 248:229-234
ISSN: 0022-0248
DOI: 10.1016/s0022-0248(02)01849-3
Popis: Acreo AB has made substantial efforts to create reproducible metalorganic vapor phase epitaxy (MOVPE) processes for the fabrication of AlGaAs/GaAs-based quantum well infrared photodetector arrays. The focus has been on two demanding areas: high reproducibility and high spatial uniformity both in material composition and in geometry. Statistical data was collected during 21 months of production. Reproducibility performance of ±3% in thickness and ±1% in composition, which has been achieved by the means of emissivity-compensated pyrometry (ECP) by using RealTemp™ control, is reported. Spatial uniformity in composition of ±0.5% and in geometry of ±1.0% is reached.
Databáze: OpenAIRE