In(Ga)As/GaAs(001) quantum dot molecules probed by nanofocus high resolution x-ray diffraction with 100 nm resolution

Autor:	M. Dubslaff, Gregory J. Salamo, Zh. M. Wang, Christian G. Schroer, Michael Hanke, Robert Hoppe, M. Burghammer, Jihoon Lee, S. Schöder, Yu. I. Mazur
Rok vydání:	2011
Předmět:	Diffraction Physics Physics and Astronomy (miscellaneous) Condensed matter physics Scattering Resolution (electron density) Molecular physics Gallium arsenide chemistry.chemical_compound chemistry Correlation function Quantum dot X-ray crystallography Beam (structure)
Zdroj:	Applied Physics Letters. 98:213105
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.3593960
Popis:	In(Ga)As quantum dots, which laterally self-assemble into quantum dot molecules, have been studied by scanning x-ray nanodiffraction, finite element calculations and subsequent kinematical diffraction simulations. X-ray beam sizes of 100 nm enable small scattering volumes comparable to the object size at extremely high local flux densities (≈104 photons nm−2 s−1). By that bulk contributions to the scattering are effectively reduced. Area maps of various individual quantum dot molecules have been measured, whereas the diffraction patterns therein reveal spatially resolved information about the inter quantum dot position correlation function.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c172cec9ed65b4c8aae9156732e501bc https://doi.org/10.1063/1.3593960 Zobrazit plný text záznamu