| Autor: |
J. Yi, Yanbo Wang, Z.X. Gao, Zhang Yaolei, J. Sun |
| Rok vydání: |
2018 |
| Předmět: |
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| Zdroj: |
2018 International Conference on Radiation Effects of Electronic Devices (ICREED). |
| DOI: |
10.1109/icreed.2018.8905049 |
| Popis: |
A new method of evaluating Shielding Thicknesses and radiation dose based on structure surface cloud picture is proposed in this paper. The principle, process and analysis character of this method are introduced. An aircraft structure model is analyzed contrasting with one-dimensional pattern. This method can be used for evaluating total dose effects of complicated structure aircraft quickly, and the display effect of this method is direct. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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