Session details: Analyzing Reliability, Defects and Patterning

Autor:	Gaurav Rajavendra Reddy, Kostas Adam
Rok vydání:	2022
Zdroj:	Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c137984606bd5d153363b30f94702a10 https://doi.org/10.1145/3578433 Zobrazit plný text záznamu