Impact of High-k Materials and Tube Numbers on CNFET Gate’s Performances

Autor:	Christofer Yalung, Doldet Tantraviwat, Sermsak Uatrongjit, Wittawat Yamwong
Rok vydání:	2023
Zdroj:	2023 5th International Conference on Smart Systems and Inventive Technology (ICSSIT).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c137933dd7b8bc80f2acd814dd3a6e5b https://doi.org/10.1109/icssit55814.2023.10060873 Zobrazit plný text záznamu