Prognosis of LED lumen degradation using Bayesian optimized neural network approach

Autor:	Karkulali Pugalenthi, Sze Li Harry Lim, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 138:114728
ISSN:	0026-2714
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c11023bc709e24d8eff6a213ab1ff194 https://doi.org/10.1016/j.microrel.2022.114728 Zobrazit plný text záznamu Full Text from ScienceDirect