Deep Learning for Nanoparticle Classification in SEM Micrographs: Systematic Mapping

Autor:	Iker Toscano, Miguel De-la-Torre, Brenda Acevedo Juarez, Gabriel Alberto Garcia Mireles
Rok vydání:	2022
Zdroj:	2022 11th International Conference On Software Process Improvement (CIMPS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c0e9191aa8542da57b50147c35c26c6c https://doi.org/10.1109/cimps57786.2022.10035714 Zobrazit plný text záznamu