X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC

Autor:	I. P. Smorchkova, B. Heying, M. Wojtowicz, Goorsky, P. Feichtinger, T.R. Block, R. Sandhu, Benjamin Poust
Rok vydání:	2004
Předmět:	Crystallography Materials science Mechanics of Materials Mechanical Engineering X-ray crystallography General Materials Science Heterojunction Condensed Matter Physics
Zdroj:	Materials Science Forum. :1601-1604
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.457-460.1601
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c0d769583a05de4d4fc0fe1168f81719 https://doi.org/10.4028/www.scientific.net/msf.457-460.1601 Zobrazit plný text záznamu