Cavity current enhancement by dielectrics

Autor: J. R. Uglum, R. G. Little, R. A. Lowell
Rok vydání: 1974
Předmět:
Zdroj: IEEE Transactions on Nuclear Science. 21:249-252
ISSN: 1558-1578
0018-9499
DOI: 10.1109/tns.1974.6498936
Popis: Charge transport within cavities is a complicated phenomena, depending on injected beam parameters, pressure and the geometry of the cavity. If there are complex distributions of conductors and/or dielectrics within the structure, an understanding of how these can affect propogation is fundamental to categorizing IEMP phenomenology.
Databáze: OpenAIRE