Autor:	Harald Vranken, David Lelouvier, T. Waayers, Herve Fleury
Rok vydání:	2002
Předmět:	Engineering Boundary scan Core test business.industry Design for testing Test compression Hardware_PERFORMANCEANDRELIABILITY Multiplexing Test (assessment) Embedded system Hardware_INTEGRATEDCIRCUITS Electrical and Electronic Engineering business Computer hardware Electronic circuit Test data
Zdroj:	Journal of Electronic Testing. 18:129-143
ISSN:	0923-8174
DOI:	10.1023/a:1014989408897
Popis:	This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for circuits in which a large number of digital IC pins is multiplexed for scan. The basic concept of E-RPCT is to provide access to the internal scan chains via an IEEE 1149.1 compatible boundary-scan architecture, instead of direct access via the IC pins. The boundary-scan chain performs serial/parallel conversion of test data. E-RPCT also provides I/O wrap to test non-contacted pins. The paper presents E-RPCT for full-scan design, as well as for full-scan core-based design.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c0a412cede50af15c7e0f6dda930fd2c https://doi.org/10.1023/a:1014989408897 Zobrazit plný text záznamu Full text from SpringerLink