SiC Die Attach for High-Temperature Applications

Autor: F. Lacroix, A. Drevin-Bazin, Jean François Barbot
Rok vydání: 2013
Předmět:
Zdroj: Journal of Electronic Materials. 43:695-701
ISSN: 1543-186X
0361-5235
DOI: 10.1007/s11664-013-2718-5
Popis: Eutectic solders AuIn19 and AuGe12 and nanosilver paste were investigated for SiC die attach in high-temperature (300°C) applications. The soldering or sintering conditions were optimized through die shear tests performed at room temperature. In particular, application of static pressure (3.5 MPa) during sintering resulted in greatly improved mechanical behavior of the nanosilver-based joint. Microstructural study of the eutectic solders showed formation of Au-rich grains in AuGe die attach and significant diffusion of Au and In through the Ni layer in AuIn19 die attach, which could lead to formation of intermetallic compounds. Die shear tests versus temperature showed that the behaviors of the studied die attaches are different; nevertheless they present suitable shear strengths required for high-temperature applications. The mechanical behavior of joints under various levels of thermal and mechanical stress was also studied. Creep experiments were carried out on the eutectic solders to describe the thermomechanical behavior of the complete module; only one creep mechanism was observed in the working range.
Databáze: OpenAIRE
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