Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review
| Autor: | A. V. Bobyl, S. G. Konnikov, M. E. Boiko, N. S. Budkina, A. M. Boiko, M. D. Sharkov |
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| Rok vydání: | 2015 |
| Předmět: |
Diffraction
Materials science Physics and Astronomy (miscellaneous) business.industry Scattering Astrophysics::High Energy Astrophysical Phenomena Experimental data Molecular physics Domain (software engineering) Crystal Optics Total external reflection X-ray crystallography business Absorption (electromagnetic radiation) |
| Zdroj: | Technical Physics. 60:1575-1600 |
| ISSN: | 1090-6525 1063-7842 |
| DOI: | 10.1134/s1063784215110067 |
| Popis: | Ways to gain and analyze experimental data obtained by X-ray techniques used in material examination are described. Emphasis is on the methods of extended X-ray absorption fine structure, X-ray diffraction, and X-ray low-angle scattering. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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