Saturation drift velocity measurement for CVD diamond by combination of a charge distribution measurement and a TOF method using a UV pulsed laser
Autor: | Y. Yamamoto, Junichi Kaneko, Takahiro Imai, Teruko Sawamura, Michihiro Furusaka, S. Kawamura, Kiichi Meguro, Koji Kobashi, Y. Oshiki, A. Homma, Kazushi Hayashi, Yoshihiro Yokota, Fumiyuki Fujita |
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Rok vydání: | 2006 |
Předmět: |
Drift velocity
business.industry Chemistry Mechanical Engineering Diamond Charge density General Chemistry Alpha particle Electron Chemical vapor deposition engineering.material Electronic Optical and Magnetic Materials Optics Electric field Materials Chemistry engineering Charge carrier Electrical and Electronic Engineering Atomic physics business |
Zdroj: | Diamond and Related Materials. 15:1508-1512 |
ISSN: | 0925-9635 |
DOI: | 10.1016/j.diamond.2005.12.002 |
Popis: | Drift velocities of charge carriers in polycrystalline diamonds were measured by a self-triggered time-of-flight (TOF) method with alpha particles based on a radiation measurement technique. Based on these measured results, a synthesis method for polycrystalline diamond was verified, and the electric properties of polycrystalline diamonds were improved; drift velocity was increased from 5 × 102 to 3 × 104 cm/s. The mean free paths (MFPs) of capture of charge carriers in a CVD single crystal diamond was obtained by induced charge distribution measurements with alpha particles, and drift velocity was measured by another TOF method using a UV pulsed laser. MFPs of capture of electron and hole in a CVD single crystal diamond were determined to be 5.4 and 9.6 μm, respectively; the hole and electron drift velocities were 5 × 105 cm/s and 3 × 105 cm/s in an electric field of 24.4 kV/cm, respectively. For diamond, short transit times of several nanoseconds and short MFPs of capture in several micrometers were successfully obtained for the first time by combining of these methods. |
Databáze: | OpenAIRE |
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