20.1 A High Common-Mode Transient Immunity GaN-on-SOI Gate Driver for High dV/dt SiC Power Switch

Autor: Si-Yi Li, Wei-Chien Hung, Tz-Wun Wang, Ya-Ting Hsu, Ke-Horng Chen, Kuo-Lin Zheng, Ying-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai
Rok vydání: 2023
Zdroj: 2023 IEEE International Solid- State Circuits Conference (ISSCC).
DOI: 10.1109/isscc42615.2023.10067394
Databáze: OpenAIRE