Scalable In-Memory Clustered Annealer With Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems

Autor: Anni Lu, Jae Hur, Yuan-Chun Luo, Hai Li, Dmitri E. Nikonov, Ian A. Young, Yang-Kyu Choi, Shimeng Yu
Rok vydání: 2023
Předmět:
Zdroj: IEEE Journal on Emerging and Selected Topics in Circuits and Systems. 13:422-435
ISSN: 2156-3365
2156-3357
Databáze: OpenAIRE