Scalable In-Memory Clustered Annealer With Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems
Autor: | Anni Lu, Jae Hur, Yuan-Chun Luo, Hai Li, Dmitri E. Nikonov, Ian A. Young, Yang-Kyu Choi, Shimeng Yu |
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Rok vydání: | 2023 |
Předmět: | |
Zdroj: | IEEE Journal on Emerging and Selected Topics in Circuits and Systems. 13:422-435 |
ISSN: | 2156-3365 2156-3357 |
Databáze: | OpenAIRE |
Externí odkaz: |