Yield and reliability analysis of digital standard cells with resistive defects
| Autor: | Wojciech Maly, M. Huber, M. Heinitz, J. Gstöttner, D. Schmitt-Landsiedel, Th. Zanon, Th. Nirschl |
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| Rok vydání: | 2000 |
| Předmět: |
Test strategy
Engineering Resistive touchscreen Yield (engineering) business.industry Failure probability Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Reliability (semiconductor) Electronic engineering Defect size Electrical and Electronic Engineering Safety Risk Reliability and Quality business human activities |
| Zdroj: | Microelectronics Reliability. 40:1635-1640 |
| ISSN: | 0026-2714 |
| Popis: | New kinds of faults in digital ICs caused by particles with a certain resistance value are presented. By using an enhanced version of a three dimensional contamination-defect-fault simulator the faulty circuit behaviour caused by these defects and appropriate test strategies have been investigated. Moreover the dependence of failure probability on the defect size has been simulated and used to obtain a reliability estimate of the analysed ICs. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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