Density profile of spin cast polymethylmethacrylate thin films
| Autor: | B M. Fanconi, Wen-Li Wu, John H. van Zanten, William J. Orts |
|---|---|
| Rok vydání: | 1994 |
| Předmět: |
chemistry.chemical_classification
Materials science Polymers and Plastics Silicon Annealing (metallurgy) Analytical chemistry chemistry.chemical_element Concentration effect Polymer Spin casting Condensed Matter Physics chemistry Materials Chemistry Wafer Physical and Theoretical Chemistry Thin film Single crystal |
| Zdroj: | Journal of Polymer Science Part B: Polymer Physics. 32:2475-2480 |
| ISSN: | 1099-0488 0887-6266 |
| DOI: | 10.1002/polb.1994.090321504 |
| Popis: | The density profiles of polymethylmethacrylate (PMMA) thin films on silicon (111) single crystal wafers were investigated via neutron reflectivity measurements. Films were prepared by spin casting PMMA onto silicon wafers from o-xylene solution followed by annealing under vacuum at 90°C for 5 h. A ∼ 45 A thick layer at the free polymer surface was observed in the as-prepared samples that has a density about half the value of bulk PMMA. After heating above 110°C, this diffuse layer disappeared and the thin film density profile was transformed to one with a sharp free polymer surface. This transition was found to be irreversible |
| Databáze: | OpenAIRE |
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