Local nm-Scale Imaging of Electrical Contact for Series Resistance Degradation of Silicon Solar Cells

Autor:	C.-S. Jiang, S. Johnston, E.A. Gauding, M.G. Deceglie, R. Flottemesch, C. Xiao, R. Moutinho, D.B. Sulas-Kern, J. Mangum, M.M. Al-Jassim, I.L. Repins
Rok vydání:	2022
Zdroj:	2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
DOI:	10.1109/pvsc48317.2022.9938916
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bf5c9ad5b9171b8f096e578285de21d6 https://doi.org/10.1109/pvsc48317.2022.9938916 Zobrazit plný text záznamu