On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)

Autor:	John Sylvestri, Orazio P. Forlenza, Donato O. Forlenza, Peilin Song, Franco Stellari, Darrell L. Miles
Rok vydání:	2009
Předmět:	Engineering Noise measurement business.industry Electrical engineering Silicon on insulator Hardware_PERFORMANCEANDRELIABILITY Noise (electronics) Temperature measurement Amplitude CMOS Logic gate Hardware_INTEGRATEDCIRCUITS Optoelectronics Light emission business Hardware_LOGICDESIGN
Zdroj:	ITC
DOI:	10.1109/test.2009.5355543
Popis:	In this paper, a new emission-based method for measuring the amplitude of on-chip power supply noise is presented. This technique uses Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC) from CMOS gates, which are used as local probe points for the noise. In order to demonstrate the capabilities of this technique, we discuss the results obtained for two early microprocessor chips fabricated in 65 nm and 45 nm Silicon On Insulator (SOI) technologies.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bf57bb5b994ec663f23f3070ebacf7b4 https://doi.org/10.1109/test.2009.5355543 Zobrazit plný text záznamu