Autor:	Kai Grurmann, Pierre Southiratn, Duc N. Nguyen, Charles Sellier, Pierre-Xiao Wang
Rok vydání:	2016
Předmět:	Engineering business.industry Error analysis DDR2 SDRAM Embedded system System level State (computer science) Radiation business Die (integrated circuit)
Zdroj:	2016 IEEE Radiation Effects Data Workshop (REDW).
DOI:	10.1109/nsrec.2016.7891748
Popis:	We report on results of TID/SEL/SEU/SEFI tests of a state of the art RH DDR2-SDRAM Memory solution. The hard errors (TID/SEL) verified at die level, and soft errors (SEU/SEFI) verified at system level.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bf52f0deacd367abf2c89fc172e2d43c https://doi.org/10.1109/nsrec.2016.7891748 Zobrazit plný text záznamu