Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps

Autor:	Lucille A. Giannuzzi, Nicolaie Moldovan, Jamie A. Trindell, Joshua D. Sugar
Rok vydání:	2022
Předmět:	General Computer Science
Zdroj:	Microscopy Today. 30:24-29
ISSN:	2150-3583 1551-9295
DOI:	10.1017/s1551929522000414
Popis:	Low-Z nanocrystalline diamond (NCD) grids have been developed to reduce spurious fluorescence and avoid X-ray peak overlaps or interferences between the specimen and conventional metal grids. The low-Z NCD grids are non-toxic and safe to handle, conductive, can be subjected to high-temperature heating experiments, and may be used for analytical work in lieu of metal grids. Both a half-grid geometry, which can be used for any lift-out method, or a full-grid geometry that can be used for ex situ lift-out or thin film analyses, can be fabricated and used for experiments.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bf472ed3b626be629805a0a249ca4e93 https://doi.org/10.1017/s1551929522000414 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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