Non-contact measurement of conductivity during growth of metal ultrathin films
| Autor: | G. Fahsold, N Magg, A. Priebe, Annemarie Pucci |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Electron mobility
Yield (engineering) Chemistry Metals and Alloys Analytical chemistry Surfaces and Interfaces Dielectric Conductivity Surfaces Coatings and Films Electronic Optical and Magnetic Materials Metal Transition metal Percolation visual_art Materials Chemistry visual_art.visual_art_medium Composite material Thin film |
| Zdroj: | Thin Solid Films. 428:107-110 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/s0040-6090(02)01225-7 |
| Popis: | Electron transport properties reflect both the size-dependent electronic structure of metal ultrathin films and their morphology. We investigate these transport properties by means of IR-transmittance spectroscopy performed during growth of iron on MgO(0 0 1) at room temperature. Careful analysis of IR-spectra allows us to detect the onset of metallic conductivity due to percolation of island-like metal films. Based on a model for the dielectric properties of metallic thin films, the IR-optical data yield a measure for the thin-film dynamic conductivity. We show that its extrapolation to the static limit provides reasonable values for the d.c.-conductivity of the growing films. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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