Atomic-force microscopy study of self-assembled atmospheric contamination on graphene and graphite surfaces
| Autor: | Alexey Frolov, Alexei Temiryazev, Marina Temiryazeva |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Materials science
Graphene Atomic force microscopy 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Overlayer Self assembled law.invention law Microscopy General Materials Science Graphite Composite material 0210 nano-technology Atmospheric contamination Layer (electronics) |
| Zdroj: | Carbon. 143:30-37 |
| ISSN: | 0008-6223 |
| Popis: | By means of high resolution atomic-force microscopy (AFM) we investigated the surface of graphene and graphite. Our study shows that if the samples were stored in ambient laboratory conditions, an adsorbate of airborne contaminants, presumably hydrocarbons, forms well-ordered layer over the whole area of graphene flakes. In general case, this layer has a stripe structure of 4–5 nm pitch with domains differing in the direction of the stripes. The size of one domain can exceed 100 μm2, which means that almost the entire area of a graphene flake can be under a layer with a constant stripe direction. By mechanical impact of AFM probe, we can turn the direction of the stripe structure, while its pitch is preserved. Visualization of the self-assembled structure may be hampered by the presence of non-ordered overlayer. |
| Databáze: | OpenAIRE |
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