Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

Autor:	I. Müller, Christiane Zamponi, S. Eichler, M. Haaks, Torsten E.M. Staab, Karin Maier
Rok vydání:	2004
Předmět:	Microprobe Materials science Optics Positron Mechanics of Materials business.industry Mechanical Engineering Spatially resolved General Materials Science Condensed Matter Physics business Crystallographic defect
Zdroj:	Materials Science Forum. :510-512
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.445-446.510
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bf0bd8229f0352a1f3a01fcade2b709b https://doi.org/10.4028/www.scientific.net/msf.445-446.510 Zobrazit plný text záznamu