Accuracy improvements in two-port noise parameter extraction method

Autor:	M. LaPorte, G. Vernet, J. Dangla, A. Boudiaf
Rok vydání:	2003
Předmět:	Engineering Equivalent series resistance business.industry Transistor Function (mathematics) High-electron-mobility transistor computer.software_genre Noise figure law.invention Simulation software Noise law Electronic engineering Reflection coefficient business computer Algorithm
Zdroj:	1992 IEEE Microwave Symposium Digest MTT-S.
DOI:	10.1109/mwsym.1992.188316
Popis:	A simple method for the determination of the two-port noise parameters is presented. It is a weighted least squares regression, where the weights are a function of the measurement uncertainties. This method fits the best minimum noise figure and noise equivalent resistance, which are the most sensitive noise parameters. A more rapid convergence and a better accuracy are demonstrated with this new method by using a reduced number of reflection coefficient states than with the method of M. Mitama and H. Katoh (1979). In order to prove that it is possible to reduce the error effect on the noise parameter extraction by choosing the right fitting algorithm, simulation software that allows the test and comparison of the different methods was developed. Experimental results are presented for a 0.25- mu m HEMT (high-electron-mobility transistor). >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bf0bd01a8f658cb930fe487aec9219b0 https://doi.org/10.1109/mwsym.1992.188316 Zobrazit plný text záznamu