Crystal orientation dependence of metal–insulator transition for VO2 microwires fabricated on TiO2(110) substrates with step and terrace structures
Autor: | Kyungmin Kim, Shingo Genchi, Shiro Yamazaki, Hidekazu Tanaka, Masayuki Abe |
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Rok vydání: | 2022 |
Předmět: | |
Zdroj: | Applied Physics Express. 15:045503 |
ISSN: | 1882-0786 1882-0778 |
DOI: | 10.35848/1882-0786/ac5c95 |
Popis: | Vanadium dioxide (VO2) thin films exhibit a metal–insulator transition (MIT) with sensitivity to the lattice strain. Substrates with step and terrace structures are an attractive platform for growing high-quality thin films. Thus, a prominent lattice strain effect could be derived using VO2 thin films on these substrates. In this study, VO2/TiO2 microwires were fabricated following the thin film growth to investigate the microwire-direction dependence of the MIT property. The in-plane crystal orientation dependence of the MIT property was enhanced for VO2/TiO2 microwires with step and terrace structures, which is promising for strain engineering in device applications. |
Databáze: | OpenAIRE |
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