Cumulative degradation methodology to predict reliability of electronic systems
| Autor: | George H. Thiel, Flavio Griggio, Sanjay Tiku |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
010302 applied physics
Materials science Monte Carlo method Load relaxation 01 natural sciences Industrial and Manufacturing Engineering Reliability engineering Prediction methods 0103 physical sciences Physics of failure Electrical and Electronic Engineering Electronic systems Reliability (statistics) Degradation (telecommunications) |
| Zdroj: | Circuit World. 48:425-433 |
| ISSN: | 0305-6120 |
| DOI: | 10.1108/cw-08-2020-0195 |
| Popis: | Purpose The purpose of this paper is to describe a novel methodology for predicting reliability for consumer electronics or any other hardware systems that experience a complex lifecycle environmental profile. Design/methodology/approach This Physics-of-Failure–based three-step methodology can be used to predict the degradation rate of a population using a Monte Carlo approach. The three steps include: using an empirical equation describing the degradation of a performance metric, a degradation consistency condition and a technique to account for cumulative degradation across multiple life-cycle stress conditions (e.g. temperature, voltage, mechanical load, etc.). Findings Two case studies are provided to illustrate the methodology including one related to repeated touch-load induced artifacts for displays. Originality/value This novel methodology can be applied to a wide range of applications from mechanical systems to electrical circuits. The results can be fed into the several stages of engineering validation to speed up product qualification. |
| Databáze: | OpenAIRE |
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