Preparation and Dielectric Investigation of Sulfonated PEEK Films for Fuel Cell Application
| Autor: | R. Pedicini, A. Sendi, Arbi Fattoum, A. Carbone |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Arrhenius equation
Range (particle radiation) Materials science Polymers and Plastics Modulus 02 engineering and technology Activation energy Dielectric 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences symbols.namesake Materials Chemistry symbols Peek Relaxation (physics) Composite material 0210 nano-technology Critical exponent |
| Zdroj: | Polymer Science, Series A. 61:940-948 |
| ISSN: | 1555-6107 0965-545X |
| DOI: | 10.1134/s0965545x19080029 |
| Popis: | Wide frequency range dielectric properties of proton conducting films of sulfonated polyetheretherketone have been investigated in the range of 0.1 Hz–1 MHz from 10 to 220°C. In all cases, the AC conductivity obeys to the universal Jonsher’s law at higher frequencies. At high temperatures, the critical exponent decreases by increasing temperature compatibly with CBH conducting model. The DC conductivity is well fitted to the Arrhenius law with decreased activation energy by increasing the sulfonation degree. By the use of the electric modulus approach, we showed the presence of two different relaxation modes thermally activated. |
| Databáze: | OpenAIRE |
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