Extraction of the Back Channel Mobility in SOI Nanowire MOS Transistors under Substrate Biasing
Autor: | Flavio E. Bergamaschi, Gilson I. Wirth, Sylvain Barraud, Mikael Casse, Maud Vinet, Olivier Faynot, Marcelo A. Pavanello |
---|---|
Rok vydání: | 2022 |
Zdroj: | 2022 IEEE Latin American Electron Devices Conference (LAEDC). |
DOI: | 10.1109/laedc54796.2022.9908214 |
Databáze: | OpenAIRE |
Externí odkaz: |