High-Resolution Microwave Near-Field Surface Imaging Using Resonance Probes
| Autor: | Oleksandr Malyuskin, Vincent Fusco |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Physics
Aperture business.industry 020208 electrical & electronic engineering Resonance 020206 networking & telecommunications Near and far field 02 engineering and technology Full width at half maximum Wavelength Optics Microwave imaging 0202 electrical engineering electronic engineering information engineering Electrical and Electronic Engineering Reflectometry business Instrumentation Image resolution |
| Zdroj: | IEEE Transactions on Instrumentation and Measurement. 65:189-200 |
| ISSN: | 1557-9662 0018-9456 |
| DOI: | 10.1109/tim.2015.2476277 |
| Popis: | A novel microwave high-resolution near-field imaging technique is proposed and experimentally evaluated in reflectometry imaging scenarios involving planar metal-dielectric structures. Two types of resonance near field probes—a small helix antenna and a loaded subwavelength slot aperture are studied in this paper. These probes enable very tight spatial field localization with the full width at half maximum around one tenth of a wavelength, $\lambda $ , at $\lambda $ /100– $\lambda $ /10 standoff distance. Importantly, the proposed probes permit resonance electromagnetic coupling to dielectric or printed conductive patterns, which leads to the possibility of very high raw image resolution with imaged feature-to-background contrast greater than 10-dB amplitude and 50° phase. In addition, high-resolution characterization of target geometries based on the cross correlation image processing technique is proposed and assessed using experimental data. It is shown that printed elements features with subwavelength size $\sim \lambda $ /15 or smaller can be characterized with at least 10-dB resolution contrast. |
| Databáze: | OpenAIRE |
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