Absolute partial cross sections for electron-impact ionization of SF6from threshold to 1000 eV

Autor:	R. Rejoub, R. F. Stebbings, D R Sieglaff, B. G. Lindsay
Rok vydání:	2001
Předmět:	Cross section (geometry) Physics Ionization Electron Atomic physics Ion pairs Condensed Matter Physics Mass spectrometry Kinetic energy Atomic and Molecular Physics and Optics Electron ionization Ion
Zdroj:	Journal of Physics B: Atomic, Molecular and Optical Physics. 34:1289-1297
ISSN:	1361-6455 0953-4075
DOI:	10.1088/0953-4075/34/7/311
Popis:	Absolute partial cross sections for electron-impact ionization of SF6 are reported for electron energies from threshold to 1000 eV. The product ions are mass analysed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ions are collected with equal efficiency irrespective of their initial kinetic energies. Data are presented for the production of SF5+, SF4+, SF3+, SF2+, (SF+ + SF42+), S+, F+, SF32+, SF22+ and SF2+ and for the total cross section, which is obtained as the sum of the partial cross sections. The overall uncertainty in the absolute cross sections for singly charged ions, except S+, is ±5%; that for S+ is ±8%. The uncertainty in the cross sections for doubly charged ions is ±12 to 15%. Data are also presented for formation of (SFn+, F+) ion pairs. Comparison is made with prior experiments and calculations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bea8ce7ec6056ce7027889b09f345132 https://doi.org/10.1088/0953-4075/34/7/311 Zobrazit plný text záznamu